Featuring Unique PeakForce IR and IR EasyAlign Technology
SANTA BARBARA, Calif.--(BUSINESS WIRE)--
Bruker today announced the release of its second-generation Inspire™
infrared (IR) nanocharacterization system, which features 10-nanometer
spatial resolution infrared chemical mapping in an easy-to-use,
laser-safe package. With IR EasyAlign™, Inspire simplifies
scattering scanning near-field optical microscopy (sSNOM), a powerful
technique for identifying chemical composition at the nanoscale. For the
first time, the highest resolution nanoscale chemical mapping now
becomes widely accessible. The system expands upon Bruker’s exclusive PeakForce
Tapping® technology to provide new information for graphene
research, polymers, complex materials and thin films, instantly
correlating chemical maps with sample properties, such as modulus,
conductivity, and workfunction. Inspire accomplishes all
of this at the highest spatial resolution, making it an exceptionally
powerful and versatile nanochemical characterization system.
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Bruker Inspire IR Nanocharacterization System (Photo: Business Wire).
“Inspire is really the first fully integrated sSNOM
solution. That combined with its PeakForce Tapping capabilities will
allow us to perform novel experiments right from the start,” said
Gilbert C. Walker, Professor of Chemistry at the University of Toronto.
“I am pleased to partner with Bruker to expand the great potential of
sSNOM as a versatile tool for broader scientific discovery.”
“Inspire is a nanoscale characterization system that
extends atomic force microscopy into the chemical regime by providing
10-nanometer correlated infrared, mechanical and topographical
information,” added Steve Minne, Ph.D., General Manager of Bruker's AFM
business. “This capability finally lets any researcher answer the
fundamental question of ‘where is it?’, and now also ‘what is it?’ at
the nanoscale.”
About Inspire
Inspire provides infrared
absorption and reflection chemical maps with a resolution only limited
by the AFM tip radius, based on scattering scanning near-field optical
microscopy. Inspire integrates all required optics,
detectors, and configurable sources, as well as AFM hardware into a
complete, laser-safe package. The system ensures accurate and optimized
data in all channels by providing decoupled, stable optical alignment
that is independent of probe position, combined with ScanAsyst®
auto-optimization of the tip-sample interaction. The result is
repeatable, expert-level data, without the need for alignment expertise.
To expand the information available, the Inspire control
integration enables the automated acquisition of hyperspectral image
stacks, while Bruker’s exclusive PeakForce
IR™ instantly correlates the nanoscale chemical information with an
expanding set of sample properties, including modulus, adhesion,
conductivity, and workfunction. This full set of information is even
accessible on samples not amenable to conventional contact and Tapping
Mode-based approaches.
About Bruker Corporation (NASDAQ: BRKR)
For more than 50
years, Bruker has enabled scientists to make breakthrough discoveries
and develop new applications that improve the quality of human life.
Bruker’s high-performance scientific research instruments and high-value
analytical solutions enable scientists to explore life and materials at
molecular, cellular and microscopic levels.
In close cooperation with our customers, Bruker is enabling innovation,
productivity and customer success in life science molecular research, in
applied and pharma applications, in microscopy, nano-analysis and
industrial applications, as well as in cell biology, preclinical
imaging, clinical research, microbiology and molecular diagnostics. For
more information, please visit: http://www.bruker.com.
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Source: Bruker Corporation